Marvel: A Vertical Resistive Accelerator for Low-Power Deep Learning Inference in Monolithic 3D

Loading...
Thumbnail Image

Other Version

External File or Record

Can’t use the file because of accessibility barriers? Contact us

Date

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Resistive memory (ReRAM) based Deep Neural Network (DNN) accelerators have achieved state-of-the-art DNN inference throughput. However, the power efficiency of such resistive accelerators is greatly limited by their peripheral circuitry including analog-to-digital converters (ADCs), digital-to-analog converters (DACs), SRAM registers, and eDRAM buffers. These power-hungry components consume 87% of the total system power, despite of the high power efficiency of ReRAM computing cores. In this paper, we propose MARVEL, a monolithic 3D stacked resistive DNN accelerator, which consists of carbon nanotube field-effect transistors (CNFETs) based low-power ADC/DACs, CNFET logic, CNFET SRAM, and high-density global buffers implemented by cross-point Spin Transfer Torque Magnetic RAM (STT-MRAM). To compensate for the loss of inference throughput that is incurred by the slow CNFET ADCs, we propose to integrate more ADC layers into MARVEL. Unlike the CMOS-based ADCs that can only be implemented in the bottom layer of the 3D structure, multiple CNFET layers can be implemented using a monolithic 3D stacking technique. Compared to prior ReRAM-based DNN accelerators, on average, MARVEL achieves the same inference throughput with 4.5× improvement on performance per Watt. We also demonstrated that increasing the number of integration layers enables MARVEL to further achieve 2× inference throughput with 7.6× improved power efficiency.

Series and Number:

EducationalLevel:

Is Based On:

Target Name:

Teaches:

Table of Contents

Description

This record is for a postprint of an article published by IEEE in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) in 2021; the version of record is available at 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) .

Citation

Journal

2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Rights

This work may be protected by copyright unless otherwise stated.