I. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays

Simple item page
dc.contributor.authorBlack, James
dc.date.accessioned2006-10-23T14:15:29Z
dc.date.available2006-10-23T14:15:29Z
dc.date.issued2005
dc.format.extent522407 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttps://hdl.handle.net/2022/392
dc.language.iso
dc.titleI. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
Black.pdf
Size:
510.16 KB
Format:
Adobe Portable Document Format
Download

Collections

C500 Reports v.45 2005-2006 (Chemistry)
Can’t use the file because of accessibility barriers? Contact us