Reactions on the Silicon (lOO)-2xl Surface: Characterization of Oxygen Insertion and the Amino Acid Deposition using Electronic Structure Theory

Ferguson, Glen

Reactions on the Silicon (lOO)-2xl Surface: Characterization of Oxygen Insertion and the Amino Acid Deposition using Electronic Structure Theory

dc.contributor.author	Ferguson, Glen
dc.date.accessioned	2006-10-17T19:13:17Z
dc.date.available	2006-10-17T19:13:17Z
dc.date.issued	2004
dc.format.extent	9968391 bytes
dc.format.mimetype	application/pdf
dc.identifier.uri	https://hdl.handle.net/2022/370
dc.language.iso		en
dc.title	Reactions on the Silicon (lOO)-2xl Surface: Characterization of Oxygen Insertion and the Amino Acid Deposition using Electronic Structure Theory	en

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C500 Reports v.44 2004-2005 (Chemistry)

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