Reactions on the Silicon (lOO)-2xl Surface: Characterization of Oxygen Insertion and the Amino Acid Deposition using Electronic Structure Theory

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dc.contributor.authorFerguson, Glen
dc.date.accessioned2006-10-17T19:13:17Z
dc.date.available2006-10-17T19:13:17Z
dc.date.issued2004
dc.format.extent9968391 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttps://hdl.handle.net/2022/370
dc.language.iso
dc.rightsThis work may be protected by copyright unless otherwise stated.
dc.titleReactions on the Silicon (lOO)-2xl Surface: Characterization of Oxygen Insertion and the Amino Acid Deposition using Electronic Structure Theory

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C500 Reports v.44 2004-2005 (Chemistry)
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