Analyzing Power Measurements for the Excitation of States in 28-Si and 24-Mg by Inelastic Scattering of Polarized Protons

dc.contributor.authorDrake, T.E.
dc.contributor.authorSobie, R.
dc.contributor.authorYen, S.
dc.contributor.authorBacher, A.D.
dc.contributor.authorEmery, G.T.
dc.contributor.authorJones, W.P.
dc.contributor.authorMiller, D.W.
dc.contributor.authorNann, H.
dc.contributor.authorOlmer, C.
dc.contributor.authorSchwandt, P.
dc.contributor.authorLove, W.G.
dc.contributor.authorPetrovich, F.
dc.date1979
dc.date.accessioned2007-11-14T19:48:40Z
dc.date.available2007-11-14T19:48:40Z
dc.date.issued1979
dc.descriptionSupported by the National Science Foundation and Indiana University
dc.format.extent308007 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationAnnual Scientific and Technical Report, 1979, 9-10.
dc.identifier.urihttps://hdl.handle.net/2022/2850
dc.language.isoen_US
dc.publisherIndiana University Cyclotron Facility
dc.rightsThis work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivs 2.5 License
dc.rights.urihttp://creativecommons.org/license/by-nc-nd/2.5
dc.subjectinelastic
dc.subjectproton
dc.subjectpower
dc.subjectexcitation
dc.subjectsilicon
dc.subjectmagnesium
dc.titleAnalyzing Power Measurements for the Excitation of States in 28-Si and 24-Mg by Inelastic Scattering of Polarized Protons
dc.typeArticle

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