Analyzing Power Measurements for the Excitation of States in 28-Si and 24-Mg by Inelastic Scattering of Polarized Protons

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dc.contributor.authorDrake, T.E.
dc.contributor.authorSobie, R.
dc.contributor.authorYen, S.
dc.contributor.authorBacher, A.D.
dc.contributor.authorEmery, G.T.
dc.contributor.authorJones, W.P.
dc.contributor.authorMiller, D.W.
dc.contributor.authorNann, H.
dc.contributor.authorOlmer, C.
dc.contributor.authorSchwandt, P.
dc.contributor.authorLove, W.G.
dc.contributor.authorPetrovich, F.
dc.date1979
dc.date.accessioned2007-11-14T19:48:40Z
dc.date.available2007-11-14T19:48:40Z
dc.date.issued1979
dc.descriptionSupported by the National Science Foundation and Indiana Universityen
dc.format.extent308007 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationAnnual Scientific and Technical Report, 1979, 9-10.en
dc.identifier.urihttps://hdl.handle.net/2022/2850
dc.language.isoen_USen
dc.publisherIndiana University Cyclotron Facilityen
dc.rightsThis work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivs 2.5 Licenseen
dc.rights.urihttp://creativecommons.org/license/by-nc-nd/2.5en
dc.subjectinelasticen
dc.subjectprotonen
dc.subjectpoweren
dc.subjectexcitationen
dc.subjectsiliconen
dc.subjectmagnesiumen
dc.titleAnalyzing Power Measurements for the Excitation of States in 28-Si and 24-Mg by Inelastic Scattering of Polarized Protonsen
dc.typeArticleen

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