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I. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays

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dc.contributor.author Black, James
dc.date.accessioned 2006-10-23T14:15:29Z
dc.date.available 2006-10-23T14:15:29Z
dc.date.issued 2005
dc.identifier.uri http://hdl.handle.net/2022/392
dc.format.extent 522407 bytes
dc.format.mimetype application/pdf
dc.language.iso en
dc.title I. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays en


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