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I. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays 134

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I. Measuring Vacuum Chamber Pressures with a Multifunction Data Acquisition Module and II. Developing a New Technique for the Charge Calibration of Highly Segmented Silicon Arrays 1 1 1 6 4 4 2

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