Browsing by Author "Jacobsen, E."
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Item Differential Cross Section and Analyzing Power of p(p,pi+)d Near Threshold(Indiana University Cyclotron Facility, 1993) Heimberg, P.; Segel, R.E.; Chen, F.; Bent, R.D.; Blomgren, J.; Meyer, H.O.; Nann, H.; von Przewoski, B.; Rinckel, T.; Zhuralev, A.; Pickar, M.; Hardie, G.; Pancella, P.; Jacobsen, E.; Brown, J.D.Item Kinematically Complete Measurements of p+p → p+n+(pi+) Near Threshold(Indiana University Cyclotron Facility, 1992) Daehnick, W.W.; Dytman, S.A.; Brooks, W.K.; Hardie, J.G.; Flammang, R.W.; Bland, L.C.; Jacobs, W.W.; Rinckel, T.C.; Pancella, P.V.; Brown, J.D.; Jacobsen, E.Item Kinematically Complete Measurements of p+p→p+n+(pi+) Near Threshold(Indiana University Cyclotron Facility, 1991) Daehnick, W.W.; Dytman, S.A.; Brooks, W.K.; Hardie, J.G.; Flammang, R.W.; Bland, L.; Jacobs, W.; Rinckel, T.; Pancella, P.; Brown, J.D.; Jacobsen, E.Item Preparations for Recoil Detection System at the Cooler T-Site(Indiana University Cyclotron Facility, 1991) Berg, G.P.A.; Bent, R.D.; Foster, C.C.; Hicks, J.; Oram, R.; Rinckel, T.; Hardie, G.; Segel, R.E.; Rehm, K.E.; Brown, J.; Jacobsen, E.Item Recoil-Ion Detection System(Indiana University Cyclotron Facility, 1992) Heimberg, P.; Segel, R.E.; Yu, Z.; Brown, J.; Jacobsen, E.; Rehm, K.E.; Homolka, J.; Schneider, R.; Hardie, G.; Pancella, P.; Sun, C.; Nann, H.; Bent, R.D.; Blomgren, J.; Saber, M.Item Studies of (p,pi) and (p,2pi) Reactions on the Indiana Cooler Ring Using Recoil-Ion Detection(Indiana University Cyclotron Facility, 1994) Chen, F.-J.; Heimberg, P.; Segel, R.; Yu, Z.; Brown, J.; Jacobsen, E.; Homolka, J.; Schneider, R.; Kurepin, A.; Zhuravlev, A.; Hardie, G.; Pancella, P.; Rehm, K.E.; Bent, R.; Blomgren, J.; Nann, H.; Rinckel, T.; Saber, M.; Sun, C.Item Studies of High Momentum Transfer Reactions by Recoil Detection: (p,π), (p,2π), and (p,γ)(Indiana University Cyclotron Facility, 1993) Segel, R.E.; Chen, F-J.; Heimberg, P.; Yu, Z.; Brown, J.; Jacobsen, E.; Homolka, J.; Schneider, R.; Zhuravlev, A.; Kurepin, A.; Hardie, G.; Pancella, P.; Rehm, K.E.; Bent, R.D.; Blomgren, J.; Nann, H.; Rinckel, T.; Saber, M.; Sun, C.